Title :
Thermoelectric properties of MnSi1.7
Author :
He, Y.J. ; Hou, Q.R. ; Wang, Z.M. ; Chen, Y.B.
Author_Institution :
Dept. of Phys., Tsinghua Univ., Beijing, China
Abstract :
Higher manganese silicide (MnSi1.7) bulk and thin-film materials have been prepared by the hot-pressed and electron-beam evaporation methods, respectively. The Seebeck coefficient, electrical resistivity, and thermal conductivity (for bulk material only) are measured from room temperature to 783 K. The un-doped bulk and thin-film MnSi1.7 are p-type. The figure of merit, ZT, of the bulk material can be reached to 0.29 at 723 K. N-type MnSi1.7 film can be obtained by addition of iron into the film. It is found that the thermoelectric properties of n-type MnSi1.7 are better than those of p-type MnSi1.7, which is consistent with the recent theoretical prediction.
Keywords :
Seebeck effect; manganese compounds; thermal conductivity; thermoelectric conversion; thin films; vacuum deposition; MnSi; Seebeck coefficient; electrical resistivity; electron-beam evaporation; hot-pressed evaporation; temperature 293 K to 783 K; thermal conductivity; thermoelectric properties; thin-film materials; Materials; Seebeck coefficient; electrical resistivity; higher manganese silicide; thermoelectric effect;
Conference_Titel :
Materials for Renewable Energy & Environment (ICMREE), 2011 International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-61284-749-8
DOI :
10.1109/ICMREE.2011.5930583