Title :
AC-JTAG: empowering JTAG beyond testing DC nets
Author :
Chung, Sung S. ; Baeg, Sang H.
Author_Institution :
Cisco Syst. Inc., San Jose, CA, USA
Abstract :
Presents the new technology that extends today´s JTAG´s capability from DC domain to both AC and DC domains. New concept, AC_EXTEST is introduced to support AC interconnection test and to have backward compatibility with EXTEST. It leverages existing application software available within the boundary-scan test industry to promote this technology to the manufacturing floor with minimal impact
Keywords :
automatic test equipment; automatic test pattern generation; boundary scan testing; fault diagnosis; integrated circuit interconnections; integrated circuit testing; AC domains; AC interconnection test; AC_EXTEST; AC-JTAG; DC domains; application software; backward compatibility; boundary-scan test industry; manufacturing floor; High speed optical techniques; Manufacturing industries; Optical devices; Optical interconnections; Optical noise; Optical receivers; Stimulated emission; Switches; Testing; Vertical cavity surface emitting lasers;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966615
