DocumentCode :
1912415
Title :
Silicon microspheres for optoelectronics
Author :
Yilmaz, Huzeyfe ; Murib, Mohammed S. ; Serpengüzel, Ali ; Taira, Kenichi ; Nakata, Josuke
Author_Institution :
Phys. Dept., Koc Univ., Istanbul, Turkey
fYear :
2011
fDate :
13-20 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Optoelectronic properties of silicon microspheres are explored. The IV characteristics show an electrical response similar to two back-to-back Schottky diodes. Optical resonances with Q-factors of 105 are observable in the elastic scattering spectra.
Keywords :
Q-factor; elemental semiconductors; micro-optics; optoelectronic devices; silicon; IV characteristics; Q-factors; Si; back-to-back Schottky diodes; elastic scattering spectra; electrical response; optoelectronic properties; silicon microspheres; Current measurement; Optical fibers; Optical imaging; Optical scattering; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
General Assembly and Scientific Symposium, 2011 XXXth URSI
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-5117-3
Type :
conf
DOI :
10.1109/URSIGASS.2011.6050598
Filename :
6050598
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1912415
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