Title :
Reflected variance estimators for simulation
Author :
Meterelliyoz, Melike ; Alexopoulos, Christos ; Goldsman, David
Author_Institution :
H. Milton Stewart Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
We study reflected standardized time series (STS) estimators for the asymptotic variance parameter of a stationary stochastic process. These estimators are based on the concept of data re-use and allow us to obtain more information about the process with no additional sampling effort. Reflected STS estimators are computed from “reflections” of the original sample path. We show that it is possible to construct linear combinations of reflected estimators with smaller variance than the variance of each constituent estimator, often at no cost in bias. We provide Monte Carlo examples to show that the estimators perform as well in practice as advertised by the theory.
Keywords :
Monte Carlo methods; parameter estimation; simulation; stochastic processes; time series; Monte Carlo examples; asymptotic variance parameter; reflected variance estimators; standardized time series estimators; stationary stochastic process; Bridges; Convergence; Equations; Limiting; Modeling; Random variables; Time series analysis;
Conference_Titel :
Simulation Conference (WSC), Proceedings of the 2010 Winter
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-9866-6
DOI :
10.1109/WSC.2010.5679063