Title :
Cross-layer design of network-coded transmission with a delay constraint
Author :
Jinfeng Du ; Adams, David C. ; Medard, Muriel
Author_Institution :
Res. Lab. of Electron., Massachusetts Inst. of Technol., Cambridge, MA, USA
fDate :
June 28 2015-July 1 2015
Abstract :
We investigate the cross-layer design of wireless networks where end-to-end data transmission is subject to delay constraint and there is no end-to-end feedback. The transmission is coded by random linear network coding (RLNC) on packet level to recover from packet erasures and by forward error-correction coding (FEC) on bit level to combat channel distortions. Based on the two-layer model developed by Adams et al. where the end-to-end coded transmission is characterized by a throughput-reliability function, we formulate the cross-layer design as a goodput optimization problem relax the integrality constraint. We show that for single-hop transmissions there exists a globally optimal operating point for the relaxed problem. For multiple-hop transmissions, the goodput function is component-wise concave with respect to the physical layer data rate over each individual link.
Keywords :
channel coding; data communication; forward error correction; linear codes; network coding; optimisation; radio networks; random codes; telecommunication network reliability; wireless channels; FEC coding; RLNC; combat channel distortion; delay constraint; end-to-end coded transmission; end-to-end data transmission; forward error correction coding; goodput optimization problem; integrality constraint; multiple hop transmission; network coded transmission cross-layer design; random linear network coding; relaxed problem; single hop transmission; throughput-reliability function; two-layer model; wireless network cross-layer design; Delays; Encoding; Optimization; Physical layer; Reliability; Wireless networks; Wireless networks; coded transmission; cross-layer design; delay constraint; optimization;
Conference_Titel :
Signal Processing Advances in Wireless Communications (SPAWC), 2015 IEEE 16th International Workshop on
Conference_Location :
Stockholm
DOI :
10.1109/SPAWC.2015.7227019