DocumentCode
1912580
Title
Enabling power density and thermal-aware floorplanning
Author
Ardestani, Ehsan K. ; Ziabari, Amirkoushyar ; Shakouri, Ali ; Renau, Jose
Author_Institution
Sch. of Eng., Univ. of California Santa Cruz, Santa Cruz, CA, USA
fYear
2012
fDate
18-22 March 2012
Firstpage
302
Lastpage
307
Abstract
With temperature being one of the main limiting factors in design of high performance processors, early evaluation of thermal effects in design stages is becoming a necessity. Floorplanning is an imperative step in the design process where thermal effects can be taken into account. This work studies a thermal-aware floorplanning scheme, with the goal of increasing both reliability and performance measures of the design. We show that a majority of thermal emergencies can be averted by a) leveraging the lateral heat transfer effects (as has been shown previously), and b) by reducing the power density of thermally critical blocks. The former becomes possible through moving, and modifying the aspect-ratio of the blocks in the floorplanning process. The latter, one of the key contributions of this work, is carried out through resizing of functional blocks in a controlled way. We also propose a selective power map generation method for the floorplanning process. In this method the time windows in which thermal emergencies occur guide the power map generation. As a result, we observed an 8.8% performance improvement, and a 40% reliability increase with the area overhead of just 3%.
Keywords
circuit layout; heat transfer; integrated circuit reliability; microprocessor chips; thermal management (packaging); heat transfer; high performance processors; power density; power map generation; reliability; thermal effects; thermal-aware floorplanning; Benchmark testing; Educational institutions; Measurement; Reliability; Floorplanning; Power Blurring; architectural level thermal simulator; thermal simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-4673-1110-6
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/STHERM.2012.6188864
Filename
6188864
Link To Document