• DocumentCode
    1912580
  • Title

    Enabling power density and thermal-aware floorplanning

  • Author

    Ardestani, Ehsan K. ; Ziabari, Amirkoushyar ; Shakouri, Ali ; Renau, Jose

  • Author_Institution
    Sch. of Eng., Univ. of California Santa Cruz, Santa Cruz, CA, USA
  • fYear
    2012
  • fDate
    18-22 March 2012
  • Firstpage
    302
  • Lastpage
    307
  • Abstract
    With temperature being one of the main limiting factors in design of high performance processors, early evaluation of thermal effects in design stages is becoming a necessity. Floorplanning is an imperative step in the design process where thermal effects can be taken into account. This work studies a thermal-aware floorplanning scheme, with the goal of increasing both reliability and performance measures of the design. We show that a majority of thermal emergencies can be averted by a) leveraging the lateral heat transfer effects (as has been shown previously), and b) by reducing the power density of thermally critical blocks. The former becomes possible through moving, and modifying the aspect-ratio of the blocks in the floorplanning process. The latter, one of the key contributions of this work, is carried out through resizing of functional blocks in a controlled way. We also propose a selective power map generation method for the floorplanning process. In this method the time windows in which thermal emergencies occur guide the power map generation. As a result, we observed an 8.8% performance improvement, and a 40% reliability increase with the area overhead of just 3%.
  • Keywords
    circuit layout; heat transfer; integrated circuit reliability; microprocessor chips; thermal management (packaging); heat transfer; high performance processors; power density; power map generation; reliability; thermal effects; thermal-aware floorplanning; Benchmark testing; Educational institutions; Measurement; Reliability; Floorplanning; Power Blurring; architectural level thermal simulator; thermal simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4673-1110-6
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2012.6188864
  • Filename
    6188864