• DocumentCode
    1912706
  • Title

    How thermal environment affects OLEDs´ operational characteristics

  • Author

    Kohári, Zsolt ; Pohl, László ; Poppe, András

  • Author_Institution
    Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2012
  • fDate
    18-22 March 2012
  • Firstpage
    331
  • Lastpage
    336
  • Abstract
    In recent years great effort has been put into development of organic light emitting diodes (OLEDs) worldwide. Among many concerns of developers is heat-removal from the thin film structure of the active layers of OLEDs which are typically realized on low thermal conductivity substrates such as glass or polymer foils. The other issue is to provide the OLEDs with transparent, yet high electrical conductivity electric power supply structure, therefore metallic shunting grids are added to the layer stack of OLEDs. These two major issues necessitate self-consistent electro-thermal simulation of large area OLEDs in which the temperature dependent I-V characteristics of the light emitting polymer layers are also considered. In this paper we discuss details of our 2.5D field-solver algorithm extended with such capabilities which was developed for the European funded Fast2Light project. The paper also presents a measurement and simulation example for a glass-based research OLED sample.
  • Keywords
    organic light emitting diodes; thermal analysis; thermal conductivity; 2.5D field-solver algorithm; OLED operational characteristics; electro-thermal simulation; glass; heat removal; high electrical conductivity electric power supply structure; light emitting polymer layers; low thermal conductivity substrates; metallic shunting grids; organic light emitting diodes; polymer foils; temperature dependent I-V characteristics; thermal environment; thin film structure; Equations; Mathematical model; Numerical models; Organic light emitting diodes; Solid modeling; Temperature measurement; Thermal resistance; OLED; electro-thermal simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4673-1110-6
  • Electronic_ISBN
    1065-2221
  • Type

    conf

  • DOI
    10.1109/STHERM.2012.6188869
  • Filename
    6188869