DocumentCode
1912706
Title
How thermal environment affects OLEDs´ operational characteristics
Author
Kohári, Zsolt ; Pohl, László ; Poppe, András
Author_Institution
Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear
2012
fDate
18-22 March 2012
Firstpage
331
Lastpage
336
Abstract
In recent years great effort has been put into development of organic light emitting diodes (OLEDs) worldwide. Among many concerns of developers is heat-removal from the thin film structure of the active layers of OLEDs which are typically realized on low thermal conductivity substrates such as glass or polymer foils. The other issue is to provide the OLEDs with transparent, yet high electrical conductivity electric power supply structure, therefore metallic shunting grids are added to the layer stack of OLEDs. These two major issues necessitate self-consistent electro-thermal simulation of large area OLEDs in which the temperature dependent I-V characteristics of the light emitting polymer layers are also considered. In this paper we discuss details of our 2.5D field-solver algorithm extended with such capabilities which was developed for the European funded Fast2Light project. The paper also presents a measurement and simulation example for a glass-based research OLED sample.
Keywords
organic light emitting diodes; thermal analysis; thermal conductivity; 2.5D field-solver algorithm; OLED operational characteristics; electro-thermal simulation; glass; heat removal; high electrical conductivity electric power supply structure; light emitting polymer layers; low thermal conductivity substrates; metallic shunting grids; organic light emitting diodes; polymer foils; temperature dependent I-V characteristics; thermal environment; thin film structure; Equations; Mathematical model; Numerical models; Organic light emitting diodes; Solid modeling; Temperature measurement; Thermal resistance; OLED; electro-thermal simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-4673-1110-6
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/STHERM.2012.6188869
Filename
6188869
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