Title :
CTL the language for describing core-based test
Author :
Kapur, Rohit ; Lousberg, Maurice ; Taylor, Tony ; Keller, Brion ; Reuter, Paul ; Kay, Douglas
Abstract :
As part of an industry wide effort the IEEE is in the process of standardizing the elements of test technology such that plug & play can be achieved when testing SoC designs. This standard under development is a language namely, Core Test Language (CTL), which is introduced in this paper. CTL describes all necessary information for test pattern reuse and the needs of test during system integration. CTL syntax and its link to STIL are explained with examples
Keywords :
IEEE standards; VLSI; application specific integrated circuits; automatic test software; computational linguistics; integrated circuit testing; logic testing; measurement standards; specification languages; timing; CTL; Core Test Language; IEEE standard; SoC test; core-based test; syntax; system integration; system-on-chip; test pattern reuse; Automatic testing; Companies; Design methodology; Graphics; Hardware; Logic testing; Performance evaluation; Plugs; Standards development; System testing;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966626
