Terahertz wave emission from layered superconductors: Interferometer measurements

Author

Ozyuzer, L. ; Turkoglu, F. ; Demirhan, Y. ; Koseoglu, H. ; Preu, S. ; Ploss, D. ; Malzer, S. ; Simsek, Y. ; Wang, H.B. ; Muller, P.

Author_Institution

Dept. of Phys., Izmir Inst. of Technol., Izmir, Turkey

fYear

2011

fDate

13-20 Aug. 2011

Firstpage

1

Lastpage

4

Abstract

Rectangular Bi₂Sr₂CaCu₂O_8+δ (Bi2212) mesa structures were fabricated on as-grown Bi2212 single crystal superconductors using standard photolithography and Ar ion beam etching techniques. We have performed c-axis resistance versus temperature (R-T), current-voltage (I-V) characteristics and bolometer measurements. Furthermore, in contrast to previous studies, the emission frequency was determined using interferometer set up instead of FTIR. The interference patterns were detected outside the cryostat after traveling long way through ambient space. The emission frequency calculated by Fourier transform of interference data is consistent with Josephson frequency-voltage relation.

Keywords

Josephson effect; bolometers; etching; interferometers; ion beam lithography; photolithography; superconducting materials; terahertz waves; FTIR; Josephson frequency-voltage relation; bolometer measurements; current-voltage characteristics; interferometer measurements; ion beam etching; layered superconductors; photolithography; rectangular mesa structures; single crystal superconductors; terahertz wave emission; Bolometers; Cavity resonators; Crystals; High temperature superconductors; Interference; Josephson junctions; Junctions;

fLanguage

English

Publisher

ieee

Conference_Titel

General Assembly and Scientific Symposium, 2011 XXXth URSI

Conference_Location

Istanbul

Print_ISBN

978-1-4244-5117-3

Type

conf

DOI

10.1109/URSIGASS.2011.6050610

Filename

6050610