• DocumentCode
    1912765
  • Title

    Proceedings International Test Conference 2001 (Cat. No.01CH37260)

  • fYear
    2001
  • fDate
    1-1 Nov. 2001
  • Firstpage
    148
  • Abstract
    ITC covers material including DFT, ATE architectures, RF testing, design-for-diagnostics, test synthesis and test generation/fault simulation. There are several sessions and presentations supporting the conference theme: tackling test trade-offs. DFT methodologies and their economic impacts will be covered. New DFT and built-in self-test methods will be explored, as well as system-on-a-chip test methods, board standards, BIST, IDDQ, ATE software, SOC testing and managing the cost of ATE.
  • Keywords
    application specific integrated circuits; automatic test equipment; automatic test pattern generation; built-in self test; fault diagnosis; integrated circuit testing; printed circuit testing; ATE; BIST; DFT; I/sub DDQ/; RF testing; SOC testing; board standards; built-in self-test methods; cost management; design-for-diagnostics; economic impacts; fault simulation; system-on-a-chip test methods; test generation; test synthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966628
  • Filename
    966628
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1912765