Title : 
High performance thermal interface materials with enhanced reliability
         
        
            Author : 
Chen, Sihai ; Lee, Ning-Cheng
         
        
            Author_Institution : 
Indium Corp., Clinton, NY, USA
         
        
        
        
        
        
            Abstract : 
Reliability has been a critical issue for thermal interface materials, especially when the materials are used for high power applications. In this paper, a series of reliability tests including baking, humidity chamber, temperature cycling, power cycling, and thermal shock have been conducted. Through comparison with conventional thermal pastes or phase change materials, a novel thermal paste with enhanced reliability is introduced. A mechanistic study has been performed to understand the reason for enhanced reliability. This paste possesses the following features and benefits: (1) Room temperature storage (2) No pump out or dry out (3) Compliable to interfaces (4) Minimal bond strength (5) No need to cure (6) No need to pre-reflow (7) Good tack for component holding (8) Easily printed or dispensed (9) Direct replacement for grease (10) Re-workable This makes it a promising candidate for an advanced thermal dissipation solution in a variety of industrial applications.
         
        
            Keywords : 
phase change materials; reliability; thermal management (packaging); baking; enhanced reliability; high performance thermal interface materials; high power applications; humidity chamber; phase change materials; power cycling; temperature cycling; thermal dissipation; thermal pastes; thermal shock; Materials reliability; Phase change materials; Silicon; Thermal resistance; Thermal interface materials; baking test; humidity chamber test; power cycling; reliability; temperature cycling; thermal cycling; thermal paste; thermal shock;
         
        
        
        
            Conference_Titel : 
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
         
        
            Conference_Location : 
San Jose, CA
         
        
        
            Print_ISBN : 
978-1-4673-1110-6
         
        
            Electronic_ISBN : 
1065-2221
         
        
        
            DOI : 
10.1109/STHERM.2012.6188872