Title :
Test and repair of large embedded DRAMs. I
Author :
McConnell, R. ; Rajsuman, R.
Author_Institution :
Infineon Technol., Munich
Abstract :
Embedded DRAM offers major advantages in terms of system integration on-chip. However, the fabrication process requires special attention for profitable manufacturing, particularly in the area of test and repair. We present the benefits which embedded DRAM offers, and then move to test issues. We provide an analysis of the technical and financial impact of different test approaches, and discuss which considerations are important in choosing a test strategy
Keywords :
DRAM chips; built-in self test; integrated circuit economics; integrated circuit testing; maintenance engineering; production testing; BIST; DRAM test issues; embedded DRAM repair; embedded DRAM test; embedded DRAMs; fabrication process; financial impact; manufacturing test; on-chip system integration; profitable manufacturing; repair; technical impact; test strategy; Automatic testing; Built-in self-test; Costs; Failure analysis; Performance evaluation; Production; Random access memory; Silicon; Software testing; System-on-a-chip;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966630
