DocumentCode :
1912876
Title :
[Back cover]
fYear :
2012
fDate :
18-22 March 2012
Abstract :
Presents the back cover of the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2012 28th Annual IEEE
Conference_Location :
San Jose, CA
ISSN :
1065-2221
Print_ISBN :
978-1-4673-1110-6
Electronic_ISBN :
1065-2221
Type :
conf
DOI :
10.1109/STHERM.2012.6188875
Filename :
6188875
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1912876
