Title :
Simulation of 0.18 Micron CMOS Device Performance
Author :
Jones, S.K. ; Badenes, G.
Author_Institution :
GEC-Marconi Materials Technology Ltd., Northants, UK
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
