A Comparison between CV and Charge-Pumping in the Extraction of MOS Interface States

Author

Giannini, M. ; Pacelli, A. ; Perron, L.M. ; Lacaita, A.L.

Author_Institution

Politecnico di Milano, Italy

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

112

Lastpage

115

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

Filename

1503501

Link To Document