DocumentCode
1913119
Title
A highly-efficient transparent online memory test
Author
Thaller, Karl
Author_Institution
Vienna Univ. of Technol., Austria
fYear
2001
fDate
2001
Firstpage
230
Lastpage
239
Abstract
The transparent online memory test (TOMT) proposed in this paper has been specifically developed for online testing of word-oriented memories with parity or Hamming code protection. Using a rotated address sequence the algorithm passes four times through the whole address space and performs embedded march tests for every word. The careful interleaving of word-oriented and bit-oriented test allows one to attain a fault coverage and a test duration comparable to the widely used March C- algorithm. The proposed memory test detects all stuck-at faults, all transition faults, all address decoder faults (even stuck-open address decoder faults), all single coupling faults (CFs, even write and read disturb CFs) and a reasonable percentage of linked CFs. Nevertheless, the algorithm is suitable for online use and can be implemented in hardware with moderate effort
Keywords
Hamming codes; automatic testing; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; Hamming code protection; address decoder faults; bit-oriented test; embedded march tests; fault coverage; parity protection; rotated address sequence; single coupling faults; stuck-at faults; test duration; transition faults; transparent online memory test; word-oriented memories; word-oriented test; Automatic testing; Decoding; Electronic components; Fault detection; Fault tolerant systems; Hardware; Performance evaluation; Protection; Read-write memory; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966638
Filename
966638
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