DocumentCode :
1913119
Title :
A highly-efficient transparent online memory test
Author :
Thaller, Karl
Author_Institution :
Vienna Univ. of Technol., Austria
fYear :
2001
fDate :
2001
Firstpage :
230
Lastpage :
239
Abstract :
The transparent online memory test (TOMT) proposed in this paper has been specifically developed for online testing of word-oriented memories with parity or Hamming code protection. Using a rotated address sequence the algorithm passes four times through the whole address space and performs embedded march tests for every word. The careful interleaving of word-oriented and bit-oriented test allows one to attain a fault coverage and a test duration comparable to the widely used March C- algorithm. The proposed memory test detects all stuck-at faults, all transition faults, all address decoder faults (even stuck-open address decoder faults), all single coupling faults (CFs, even write and read disturb CFs) and a reasonable percentage of linked CFs. Nevertheless, the algorithm is suitable for online use and can be implemented in hardware with moderate effort
Keywords :
Hamming codes; automatic testing; fault diagnosis; integrated circuit testing; integrated memory circuits; logic testing; Hamming code protection; address decoder faults; bit-oriented test; embedded march tests; fault coverage; parity protection; rotated address sequence; single coupling faults; stuck-at faults; test duration; transition faults; transparent online memory test; word-oriented memories; word-oriented test; Automatic testing; Decoding; Electronic components; Fault detection; Fault tolerant systems; Hardware; Performance evaluation; Protection; Read-write memory; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966638
Filename :
966638
Link To Document :
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