DocumentCode :
1913184
Title :
Target recognition using neural networks for model deformation measurements
Author :
Ross, Richard W. ; Hibler, David L.
Author_Institution :
NASA Langley Res. Center, Hampton, VA, USA
Volume :
5
fYear :
1999
fDate :
1999
Firstpage :
3152
Abstract :
Optical measurements provide a non-invasive method for measuring deformation of wind tunnel models. Model deformation systems use targets mounted or painted on the surface of the model to identify, known positions, and photogrammetric methods are used to calculate 3-D positions of the targets on the model from digital 2-D images. Under ideal conditions, the reflective targets are placed against a dark background and provide high-contrast images, aiding in target recognition. However, glints of light reflecting from the model surface, or reduced contrast caused by light source or model smoothness constraints, can compromise accurate target determination using current algorithmic methods. The paper describes a technique using a neural network and image processing technologies which increases the reliability of target recognition systems. Unlike algorithmic methods, the neural network can be trained to identify the characteristic patterns that distinguish targets from other objects of similar size and appearance and can adapt to changes in lighting and environmental conditions
Keywords :
feedforward neural nets; image recognition; image segmentation; learning (artificial intelligence); photogrammetry; wind tunnels; characteristic patterns; dark background; digital 2D images; high-contrast images; model deformation measurements; photogrammetric methods; reflective targets; target recognition; wind tunnel models; Aerodynamics; Cameras; Deformable models; Digital images; Image processing; Light sources; NASA; Neural networks; Target recognition; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 1999. IJCNN '99. International Joint Conference on
Conference_Location :
Washington, DC
ISSN :
1098-7576
Print_ISBN :
0-7803-5529-6
Type :
conf
DOI :
10.1109/IJCNN.1999.836156
Filename :
836156
Link To Document :
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