Title : 
On a Simple Method for Estimating International Roughness Index Using a Profilograph
         
        
            Author : 
Dyer, Justin S. ; Dyer, Stephen A. ; Day, Dwight D. ; Devore, John J.
         
        
            Author_Institution : 
Surface Systems & Instruments, LLC, Manhattan, KS 66502 USA. E-mail: j.dyer@ieee.org
         
        
        
        
        
        
            Abstract : 
In this paper, we derive a simple method for estimating the International Roughness Index (IRI) of a pavement profile using data collected by a computerized profilograph. The algorithm presented herein achieves this by estimating the standard deviation of the point-to-point slope of the pavement from the profilograph´s recorded data and then mapping this to an expected IRI via a theoretically justified equation which we derive. We demonstrate the performance of this approach via numerical simulation and analysis.
         
        
            Keywords : 
Displacement measurement; Electronic mail; Nonlinear optics; Optical filters; Optical recording; Rough surfaces; State estimation; Surface roughness; Testing; Wheels; International Roughness Index; Profilograph; Uniformly minimum variance unbiased estimator;
         
        
        
        
            Conference_Titel : 
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
         
        
            Conference_Location : 
Victoria, BC, Canada
         
        
        
            Print_ISBN : 
978-1-4244-1540-3
         
        
            Electronic_ISBN : 
1091-5281
         
        
        
            DOI : 
10.1109/IMTC.2008.4547285