Title :
A novel method for RF device´s contact test
Author :
Cheng-Nan Hu ; Kai-Hong Jeng ; Wen-Ju Chen ; Hsuan-Chung Ko
Author_Institution :
Oriental Inst. of Technol., Taipei, Taiwan
Abstract :
A novel method for RF device´s contact test is proposed to improve the yield of the RFIC test employing test less technique. An equivalent circuit for modeling the RF device incorporating RF traces with contact impedance is applied for theoretical analysis of prototype design. Measured data of RF devices testing attained in production runs precisely address the contact issue using the novel methodology present here.
Keywords :
electrical contacts; equivalent circuits; integrated circuit design; integrated circuit modelling; integrated circuit testing; radiofrequency integrated circuits; RF device contact test; RF traces; RFIC test; contact impedance; equivalent circuit; test less technique; Electrostatic discharges; Frequency measurement; Integrated circuit modeling; Loss measurement; Radio frequency; Testing; Transmission line measurements; Auto Test Equipment (ATE); Multi-Chip Module (MCM); System-in-Package (SiP);
Conference_Titel :
Wireless Symposium (IWS), 2014 IEEE International
Conference_Location :
X´ian
DOI :
10.1109/IEEE-IWS.2014.6864198
