DocumentCode :
1913548
Title :
Time resolved neutron and hard X-ray emission in the dense plasma focus, revisited
Author :
Brzosko, J.S. ; Nardi ; Powedll, C. ; Brzosko, J.R.
Author_Institution :
Compton Res. Labs., New York, NY, USA
fYear :
1997
fDate :
19-22 May 1997
Firstpage :
277
Lastpage :
278
Abstract :
Summary form only given. The time dependence of the MeV ion abundance can provide critical information on acceleration mechanisms in the dense plasma of focused discharges. Time resolved measurements of neutrons and hard X-rays are used to gauge the time evolution of ion population. The plasma focus (7 kJ; 17 kV) chamber was filled with O/sub 2/ (10%) and D/sub 2/ (90%) mixture. Time resolved measurements were done at different distances from the pinch (L) and at different angles (/spl theta/) from the electrode axis by NE102 (L=0.15 m; /spl theta/=0/spl deg/) and NE111 (L=3.8 m; /spl theta/=0/spl deg/ & 90/spl deg/) plastic scintillators. Time integrated absolute measurements of total yield of D(d,n)/sup 3/He and /sup 16/O(d,n)/sup 17/F nuclear reactions were used to establish population of low (E<0.5 MeV) and high (E/sub i/>2 MeV) energy ions. Measured neutron and hard X-ray signals (E/sub x//spl ges/100 keV) were unfolded to recover the real time resolved emission signals P/sub n/ & P/sub x/, respectively.
Keywords :
discharges (electric); pinch effect; plasma diagnostics; plasma focus; scintillation counters; /sup 16/O(d,n)/sup 17/F; 0.5 MeV; 100 keV; 17 kV; 2 MeV; 7 kJ; D(d,n)/sup 3/He; MeV ion abundance; acceleration mechanisms; dense plasma focus; focused discharges; hard X-ray emission; ion population time evolution; neutron emission; nuclear reaction total yield; plastic scintillators; time integrated absolute measurements; time resolved measurements; Acceleration; Electrodes; Energy measurement; Neutrons; Plasma accelerators; Plasma density; Plasma measurements; Plasma x-ray sources; Plastics; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.605064
Filename :
605064
Link To Document :
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