Conducted RFI emission from an AC-DC converter with sinusoidal line current

Author

Mahdavi, J. ; Roudet, J. ; Scheich, R. ; Rognon, J.P.

Author_Institution

Dept. of Electr. Eng., Sharif Univ. of Technol., Teheran, Iran

fYear

1993

fDate

2-8 Oct 1993

Firstpage

1048

Abstract

The authors discuss the generation and modeling of conducted electromagnetic interference (EMI) in a single-phase AC/DC power converter with sinusoidal line current at unity power factor. The converter is composed of a diode rectifier and a conventional boost converter with pulsewidth modulation (PWM) control. Due to this control mode the input current has a very low content of harmonics (the multiple of mains frequency is 50 Hz); thus, power supply voltage distortion is considerably reduced. Noise generation and emission in the radio-frequency range (10 kHz-30 MHz), i.e., radio-frequency interference are highlighted. Their characterization requires a precise knowledge of the input current, which is simulated with a particular software. Noise signal measurements are carried out by means of a line impedance stabilization network, a standardized measuring tool

Keywords

circuit analysis computing; digital simulation; harmonics; power convertors; power engineering computing; pulse width modulation; radiofrequency interference; rectifying circuits; 10 kHz to 30 MHz; 50 Hz; EMI; PWM; RFI; boost; characterization; computer simulation; conducted electromagnetic interference; diode rectifier; harmonics; line impedance stabilization network; noise signal measurements; single-phase AC/DC power converter; sinusoidal line current; software; unity power factor; voltage distortion; AC generators; AC-DC power converters; DC generators; Electromagnetic interference; Impedance measurement; Noise measurement; Pulse width modulation; Pulse width modulation converters; Radio frequency; Radiofrequency interference;

fLanguage

English

Publisher

ieee

Conference_Titel

Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE

Conference_Location

Toronto, Ont.

Print_ISBN

0-7803-1462-X

Type

conf

DOI

10.1109/IAS.1993.299027

Filename

299027