مرکز منطقه ای اطلاع رساني علوم و فناوري - New Lifetime Prediction Method Based on the Control of the Secondary Impact Ionization with the Substrate Bias

DocumentCode :

1913765

Title :

New Lifetime Prediction Method Based on the Control of the Secondary Impact Ionization with the Substrate Bias

Author :

Marchand, B. ; Ghibaudo, G. ; Balestra, F. ; Guégan, G. ; Deleonibus, S.

Author_Institution :

ENSERG, Grenoble, France

fYear :

1998

fDate :

8-10 Sept. 1998

Firstpage :

212

Lastpage :

215

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location :

Bordeaux, France

Print_ISBN :

2-86332-234-6

Type :

conf

Filename :

1503526

Link To Document :