DocumentCode
1913769
Title
Testing and programming flash memories on assemblies during high volume production
Author
de Jong, F.G.M. ; Biewenga, A.S. ; Van, Geest D C L ; Waayers, T.F.
Author_Institution
Philips Res. Lab., Eindhoven, Netherlands
fYear
2001
fDate
2001
Firstpage
470
Lastpage
479
Abstract
Testing and programming flash memories is becoming increasingly important when producing high volumes of assemblies. There is a growing trend to program the flash memories during board assembly by means of a tester, moving programming issues to the test department. Problematic is the relatively long time required for programming the flash devices in the production line. This is a strong driver for testing connectivity before programming. In order to reduce the programming time methods are discussed and a Fast Flash Controller (FFC) is presented which enables programming of flash memories close to their maximum programming speed
Keywords
flash memories; integrated circuit testing; Fast Flash Controller; circuit assembly; circuit programming; circuit testing; flash memory; high volume production; Assembly; Consumer products; Flash memory; Functional programming; Manufacturing; Pipelines; Production; Programming profession; Software testing; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966664
Filename
966664
Link To Document