DocumentCode :
1913769
Title :
Testing and programming flash memories on assemblies during high volume production
Author :
de Jong, F.G.M. ; Biewenga, A.S. ; Van, Geest D C L ; Waayers, T.F.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
fYear :
2001
fDate :
2001
Firstpage :
470
Lastpage :
479
Abstract :
Testing and programming flash memories is becoming increasingly important when producing high volumes of assemblies. There is a growing trend to program the flash memories during board assembly by means of a tester, moving programming issues to the test department. Problematic is the relatively long time required for programming the flash devices in the production line. This is a strong driver for testing connectivity before programming. In order to reduce the programming time methods are discussed and a Fast Flash Controller (FFC) is presented which enables programming of flash memories close to their maximum programming speed
Keywords :
flash memories; integrated circuit testing; Fast Flash Controller; circuit assembly; circuit programming; circuit testing; flash memory; high volume production; Assembly; Consumer products; Flash memory; Functional programming; Manufacturing; Pipelines; Production; Programming profession; Software testing; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966664
Filename :
966664
Link To Document :
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