• DocumentCode
    1913785
  • Title

    Investigations of the Thermal Behaviour of Low-k Dielectrics Based on Smart Designed Electromigration Lines

  • Author

    Ionescu, A.M. ; Mondon, F. ; Reimbold, G. ; Blachier, D. ; Arnaud, L. ; Waltz, P. ; Morand, Y.

  • Author_Institution
    LETI-CEA/Grenoble, France
  • fYear
    1998
  • fDate
    8-10 Sept. 1998
  • Firstpage
    216
  • Lastpage
    219
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1998. Proceeding of the 28th European
  • Conference_Location
    Bordeaux, France
  • Print_ISBN
    2-86332-234-6
  • Type

    conf

  • Filename
    1503527
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1913785