Title :
A practical guide to combining ICT & boundary scan testing
Abstract :
This paper focuses on the practical aspects of combining boundary scan testing with traditional In-Circuit Test. The fault coverage, diagnostic, fixturing, and throughput benefits that can be realized by testing with a combined BSCAN/ICT strategy are described, along with the specific issues and challenges involved in providing a comprehensive BSCAN/ICT solution
Keywords :
boundary scan testing; circuit testing; fault diagnosis; BSCAN/ICT; boundary scan testing; fault coverage; fault diagnosis; fixturing; in-circuit testing; throughput; Fault detection; Fault diagnosis; Fixtures; Geometry; Manufacturing; Performance evaluation; Pins; Probes; Testing; Throughput;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966666
