DocumentCode
1913914
Title
A method to improve SFDR with random interleaved sampling method
Author
Tamba, Mamoru ; Shimizu, Atsushi ; Munakata, Hideharu ; Komuro, Takanori
Author_Institution
Agilent Technol. Japan Ltd., Japan
fYear
2001
fDate
2001
Firstpage
512
Lastpage
520
Abstract
Recent high-speed ADCs, especially for communication applications, require higher sampling rates with wide spurious free dynamic range (SFDR). To achieve high sampling rate, a time-interleaved ADC architecture is quite popular and can be seen in many papers. However it is also well known that spurious components occur when using this conventional interleaved sampling method. These spurious components seriously affect SFDR. This paper newly proposes the random interleaved sampling method so that we can completely remove these components and get better SFDR
Keywords
analogue-digital conversion; circuit simulation; delays; high-speed integrated circuits; integrated circuit testing; signal sampling; SFDR; high-speed ADCs; random interleaved sampling method; sampling rates; spurious components; spurious free dynamic range; time-interleaved architecture; Amplitude modulation; Clocks; Degradation; Delay; Dynamic range; Frequency domain analysis; Oscilloscopes; Sampling methods; System testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966669
Filename
966669
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