Title :
A method to improve SFDR with random interleaved sampling method
Author :
Tamba, Mamoru ; Shimizu, Atsushi ; Munakata, Hideharu ; Komuro, Takanori
Author_Institution :
Agilent Technol. Japan Ltd., Japan
Abstract :
Recent high-speed ADCs, especially for communication applications, require higher sampling rates with wide spurious free dynamic range (SFDR). To achieve high sampling rate, a time-interleaved ADC architecture is quite popular and can be seen in many papers. However it is also well known that spurious components occur when using this conventional interleaved sampling method. These spurious components seriously affect SFDR. This paper newly proposes the random interleaved sampling method so that we can completely remove these components and get better SFDR
Keywords :
analogue-digital conversion; circuit simulation; delays; high-speed integrated circuits; integrated circuit testing; signal sampling; SFDR; high-speed ADCs; random interleaved sampling method; sampling rates; spurious components; spurious free dynamic range; time-interleaved architecture; Amplitude modulation; Clocks; Degradation; Delay; Dynamic range; Frequency domain analysis; Oscilloscopes; Sampling methods; System testing; Timing;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966669
