Title :
Computer as a Tool for Nanocluster NVM Cells Diagnostics
Author :
Turchanikov, V. ; Nazarov, A. ; Lysenko, V. ; Winkler, O. ; Spangenberg, B. ; Kurz, H.
Author_Institution :
Lashkaryov Inst. of Semicond. Phys. NAS Ukraine, Kyiv
Abstract :
Development of nanocluster based non volatile memory (NVM) cells instead of the commonly used floating gate structures requires a new approach to the reliability testing of nanocluster NVM structures. The algorithm of this testing is rather complex and cannot be implemented without computer based diagnostic systems. The paper presented deals with the testing algorithms of the nanocluster NVM cells and, also, with software and hardware needed for algorithm realization
Keywords :
electronic engineering computing; flash memories; integrated circuit reliability; integrated circuit testing; nanoelectronics; computer based diagnostic system; nanocluster NVM cells diagnostics; nonvolatile memory; reliability testing; Data acquisition; Electric breakdown; Nanostructures; Nonvolatile memory; Software algorithms; Software measurement; Software testing; System testing; Time measurement; Velocity measurement; nanoclusters; nanodots; reliability; testing;
Conference_Titel :
Computer as a Tool, 2005. EUROCON 2005.The International Conference on
Conference_Location :
Belgrade
Print_ISBN :
1-4244-0049-X
DOI :
10.1109/EURCON.2005.1629935
