DocumentCode

1913983

Title

Drain Resistance and Channel Mobility Degradation in Hot-Carrier Stresses NMOSFETs

Author

Lou, C.L. ; Chim, W.K. ; Chan, D.S.H.

Author_Institution

Hewlett-Packard Singapore, Singapore

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

244

Lastpage

247

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

conf

Filename

1503534