Title :
A case study on the implementation of the Illinois Scan Architecture
Author :
Hsu, Frank F. ; Butler, Kenneth M. ; Patel, Janak H.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
Scan based test techniques offer a very efficient alternative to achieve high fault coverage when compared to functional pattern testing. As circuit sizes grow ever larger, test data volume and test application time grow unwieldy even in the very efficient scan based designs. The Illinois Scan Architecture is a low cost alternative to conventional scan. In this paper, we present the first ever reported case study of the effectiveness of the Illinois Scan Architecture on an industrial circuit
Keywords :
automatic test equipment; fault location; integrated circuit testing; production testing; IC testing; Illinois Scan Architecture implementation; circuit sizes; efficient scan based designs; fault coverage; functional pattern testing; industrial circuit; scan based test techniques; test application time; test data volume; Automatic logic units; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Clocks; Computer aided software engineering; Costs; Integrated circuit testing; Logic testing;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966672
