Title :
MOS model 9 Parameter Extraction with Realistic Time-Dependence for Hot-Carrier Reliability Simulation
Author :
Lunenborg, M.M. ; Boter, J.D. ; Velghe, R.M.D.A.
Author_Institution :
Philips Semiconductors, Nijmegen, Netherlands
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
