MOS model 9 Parameter Extraction with Realistic Time-Dependence for Hot-Carrier Reliability Simulation

Author

Lunenborg, M.M. ; Boter, J.D. ; Velghe, R.M.D.A.

Author_Institution

Philips Semiconductors, Nijmegen, Netherlands

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

248

Lastpage

251

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

Filename

1503535

Link To Document