• DocumentCode
    1914052
  • Title

    Application to microbiological fermentation fault diagnosis for relevance vector machine

  • Author

    Sun, Zonghai ; Sun, Youxian

  • Author_Institution
    Nat. Lab. of Ind. Control Technol., Zhejiang Univ., Hangzhou, China
  • Volume
    2
  • fYear
    2003
  • fDate
    23-25 June 2003
  • Firstpage
    1395
  • Abstract
    Microbiological fermentation is a kind of complicated batch process that is severely nonlinear and time variant. There are many process parameters needed to monitor and control in order to make the microbiological fermentation process successful. So it is important to fault diagnose for microbiological fermentation sensor. In this paper we provide a new method for fault diagnosis of microbiological fermentation, i.e. two relevance vector machines which are viewed as observer and classifier respectively. The observer is applied to estimate release rate of carbon dioxide to gain residual sequence. The classifier is applied to the residuals. The results of experiments demonstrate that this method can effectively diagnose instrument faults.
  • Keywords
    batch processing (industrial); fault diagnosis; fermentation; process control; process monitoring; fault diagnosis; microbiological fermentation; relevance vector machine; residual sequence; Carbon dioxide; Condition monitoring; Delay; Fault diagnosis; Fungi; Instruments; Pressure control; Sun; Support vector machines; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications, 2003. CCA 2003. Proceedings of 2003 IEEE Conference on
  • Print_ISBN
    0-7803-7729-X
  • Type

    conf

  • DOI
    10.1109/CCA.2003.1223217
  • Filename
    1223217