99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor

Author

Kusko, Mary P. ; Robbins, Bryan J. ; Koprowski, Timothy J. ; Huott, William V.

Author_Institution

IBM Corp., Poughkeepsie, NY, USA

fYear

2001

fDate

2001

Firstpage

586

Lastpage

592

Abstract

This paper explains a new logic built-in self-test (LBIST) technique used in production on the zSeries 900 microprocessor and associated cache chips. LBIST is a test technique critical to the S/390 suite of tests. Various improvements have been made over successive generations of S/390 part numbers. New for the ´00 design is the programmable selection of weights during LBIST. This is a comprehensive paper covering why we wanted to improve LBIST, how we improved it, choices made in implementing the enhancement and the results. The results include both the improved LBIST fault coverage and a discussion of the empirical fallout data showing the effectiveness of this technique in production. In addition, we include an example showing added benefits of the new technique

Keywords

built-in self test; cache storage; fault location; integrated circuit testing; logic testing; microprocessor chips; production testing; 1 GHz; AC test coverage; IBM S/390 zSeries 900 microprocessor; LBIST; LBIST fault coverage; S/390 part numbers; S/390 test suite; cache chips; empirical fallout data; logic BIST; logic built-in self-test; programmable weight selection; test technique; Automatic testing; Built-in self-test; Clocks; Costs; Logic arrays; Logic devices; Logic testing; Microprocessors; Packaging; Production;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2001. Proceedings. International

Conference_Location

Baltimore, MD

ISSN

1089-3539

Print_ISBN

0-7803-7169-0

Type

conf

DOI

10.1109/TEST.2001.966677

Filename

966677