مرکز منطقه ای اطلاع رساني علوم و فناوري - Analysis of SiGe HBT Characteristic Times

DocumentCode :

1914127

Title :

Analysis of SiGe HBT Characteristic Times

Author :

Aniel, F. ; Zerounian, N. ; Gruhle, A. ; Mähner, C. ; Crozat, P. ; Adde, R.

Author_Institution :

Universite de Paris XI, Orsay, France

fYear :

1998

fDate :

8-10 Sept. 1998

Firstpage :

264

Lastpage :

267

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location :

Bordeaux, France

Print_ISBN :

2-86332-234-6

Type :

conf

Filename :

1503539

Link To Document :