DocumentCode

1914127

Title

Analysis of SiGe HBT Characteristic Times

Author

Aniel, F. ; Zerounian, N. ; Gruhle, A. ; Mähner, C. ; Crozat, P. ; Adde, R.

Author_Institution

Universite de Paris XI, Orsay, France

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

264

Lastpage

267

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

conf

Filename

1503539