• DocumentCode
    1914135
  • Title

    Relationship between the 200-mm wafer size and the sub micron technologies

  • Author

    Brillouët, Michel

  • Author_Institution
    Centre Commun CNET SGS-THOMSON, France Telecom, Crolles, France
  • fYear
    1993
  • fDate
    13-16 Sept. 1993
  • Firstpage
    473
  • Lastpage
    480
  • Abstract
    The trend of increasing the wafer size towards 200-mm is driven by the reduction of the high-volume production cost of large circuits. At the same time, the compatibility with deep submicron processes should be preserved. This dictates tight specifications on the bare substrate itself (e.g. flatness) and on the process equipments, some of which being discussed here. Moreover the increased size and cost of the wafers need to reconsider usual ways in the development of processes and in the manufacturing rules. This later subject will be outlined in the second part of this paper.
  • Keywords
    integrated circuit manufacture; deep submicron process; high-volume production cost; large circuit; size 200 mm; submicron technology; wafer size; Automatic control; Automation; Circuits; Costs; Economics; Manufacturing processes; Particle production; Productivity; Telecommunications; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European
  • Conference_Location
    Grenoble
  • Print_ISBN
    2863321358
  • Type

    conf

  • Filename
    5435547