Title :
Towards a unified test process: from UML to end-of-line functional test
Author :
Baldini, Andrea ; Benso, Alfredo ; Prinetto, Paolo ; Mo, Sergio ; Taddei, Andrea
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
Abstract :
In this paper, we propose the use of a UML methodology to go from user requirements and specifications to end of production testing of complex embedded systems. We consider behavioral, structural and physical levels building a comprehensive and modular model. The process contains the definition of a set of properties being created and then updated in each phase, and heavily relies on message passing and elaborating facilities to increase both abstraction and descriptive power. Result of the process is test pattern generation using custom ATE commands. We also present and discuss an underdevelopment case study of a significantly complex automotive application
Keywords :
automatic test equipment; automatic test pattern generation; automotive electronics; embedded systems; logic testing; message passing; production testing; specification languages; UML methodology; abstraction; automotive application; behavioral levels; complex embedded systems; comprehensive modular model; custom ATE commands; descriptive power; end-of-line functional test; message passing; physical levels; production testing; structural levels; test pattern generation; unified modeling language; unified test process; user requirements; user specifications; Automatic testing; Automotive applications; Buildings; Electronic equipment testing; Embedded software; Embedded system; Production systems; Research and development; System testing; Unified modeling language;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966679
