Title :
Built-In-Self-Test (BIST) probing for wireless non-contact measurement and characterization of integrated circuits and systems
Author :
Wane, S. ; Ranaivoniarivo, M. ; Elkassir, B. ; Kelma, C. ; Tesson, O. ; Goulet, F. ; Descamps, P. ; Gamand, P.
Author_Institution :
NXP-Semicond., Caen, France
Abstract :
This paper discusses concept and feasibility of wireless BIST probing for non-contact measurement and characterization. Inter-Chip noise interferences as function of wireless coupling-path attributes (wireless separation distance between emitter and receiver chips, injected power levels, Charge-Pump-Current) are characterized. Study of BIST for reconfigurability of on-chip functions is investigated based on design of programmable automatic oscillation amplitude control of PLL reference oscillators. Impacts of BIST circuits on system performances are evaluated based on simulation analysis and experimental verifications.
Keywords :
built-in self test; integrated circuit testing; oscillators; phase locked loops; radiofrequency integrated circuits; radiofrequency interference; radiofrequency measurement; BIST circuits; PLL reference oscillators; integrated circuit characterization; interchip noise interferences; programmable automatic oscillation amplitude control; wireless BIST probing; wireless built-in-self-test probing; wireless coupling-path; wireless noncontact measurement; Built-in self-test; Oscillators; Phase locked loops; Receivers; Semiconductor device measurement; Wireless communication; Wireless sensor networks;
Conference_Titel :
General Assembly and Scientific Symposium, 2011 XXXth URSI
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-5117-3
DOI :
10.1109/URSIGASS.2011.6050666
