Title :
Data Retention in SOI-DRAM with Trench Capacitor Cell
Author :
Hanafi, Hussein I. ; Kanarsky, T. ; Schmitz, Stefan ; Hathorn, Kevin
Author_Institution :
IBM Corporation, Yorktown Heights, NY, United States
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
