DocumentCode :
1914369
Title :
Rapid MOS-CV Generation Lifetime Mapping Technique for the Characterisation of High Quality Silicon
Author :
Sorge, R. ; Schley, P. ; Grabmeier, J. ; Obermeier, G. ; Huber, D. ; Richter, H.
Author_Institution :
Institute for Semiconductor Physics, Frankfurt (Oder), Germany
fYear :
1998
fDate :
8-10 Sept. 1998
Firstpage :
296
Lastpage :
299
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
Type :
conf
Filename :
1503547
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1914369