Title :
A survey of artificial neural networks based fault detection and fault diagnosis techniques
Author_Institution :
LERISS/Div. Reseaux Neuronaux, Univ. Paris XII, Lieusaint, France
Abstract :
We present several neural network based approaches to analog circuits fault defection and fault diagnosis using different neural networks based structures. The paper focuses on the one hand, on multi-neural networks approaches, and on the other hand, on real time implementation of neural based fault diagnosis techniques. Simulation and experimental results, are reported
Keywords :
VLSI; analogue integrated circuits; fault diagnosis; image classification; inspection; neural nets; artificial neural networks based fault detection; multi-neural networks approaches; real time implementation; Analog circuits; Artificial neural networks; Electrical fault detection; Electronic circuits; Electronic mail; Fault detection; Fault diagnosis; Multi-layer neural network; Neural networks; Production systems;
Conference_Titel :
Neural Networks, 1999. IJCNN '99. International Joint Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5529-6
DOI :
10.1109/IJCNN.1999.836218
