• DocumentCode
    1914700
  • Title

    Analysis of AVC Measurements

  • Author

    Rottinger, Martin ; Seifert, Norbert ; Selberherr, Siegfried

  • Author_Institution
    TU Vienna, Austria
  • fYear
    1998
  • fDate
    8-10 Sept. 1998
  • Firstpage
    344
  • Lastpage
    347
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1998. Proceeding of the 28th European
  • Conference_Location
    Bordeaux, France
  • Print_ISBN
    2-86332-234-6
  • Type

    conf

  • Filename
    1503559