Title :
0.18um CMOS Tradeoffs between Isolation, Latch-up and Junction Capacitance
Author :
Sallagoity, P. ; Poncet, A. ; Haond, M.
Author_Institution :
France Telecom, Meylan, France
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
