Title :
A New Very High Density Full Feature EEPROM Cell with minimum Process Complexity
Author :
Bergemont, Albert ; Haggag, Hosam ; Hart, Mike ; Anderson, Larry
Author_Institution :
Nat. Semicond. Inc., Santa Clara, CA, USA
Abstract :
A new highly reliable 3.3V only EEPROM cell technology has been developed . Using this cell concept and technology, a 9.5//2 cell has been manufactured in 0.8μ design rules. Further scaling will lead to a 5μ2 cell in 0.5μ design rules . It is also possible to construct the cell without the access transistor [3]. This lead to another 10 to 15% cell size reduction making the cell competitive in size with Flash Eproms .This new cell concept is very promising for embedded applications requiring high density ( a 4 M ) as well as stand alone low power mobile computing storage applications .
Keywords :
EPROM; flash memories; access transistor; flash EPROM; high density full feature EEPROM cell; minimum process complexity; stand alone low power mobile computing storage applications; voltage 3.3 V; EPROM; Electrons; Lead compounds; Nonvolatile memory; PROM; Size control; Standards development; Thickness control; Tunneling; Variable structure systems;
Conference_Titel :
Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European
Conference_Location :
Grenoble