DocumentCode :
1914867
Title :
Identifying redundant gate replacements in verification by error modeling
Author :
Radecka, Katarzyna ; Zilic, Zeljko
Author_Institution :
McGill Univ., Montreal, Que., Canada
fYear :
2001
fDate :
2001
Firstpage :
803
Lastpage :
812
Abstract :
This paper considers verification of combinational circuits by test vectors under assumption of gate and wire replacement faults. Identifying redundant faults is critical to the quality and speed of such verification schemes. We propose the first known exact redundancy identification of gate replacement faults, together with its efficient approximations. While both solutions use the SAT formulation of redundancy identification, we propose the means to effectively use any single stuck-at-value redundancy identification in the approximate schemes, with varying detection accuracy. Critical to the latter are the novel uses of don´t care approximations that detect many redundant faults and quickly identify those that can be detected by methods for stuck-at value faults. A test generation scheme that uses the error-correcting properties of Arithmetic Transforms is incorporated into the overall verification procedure, and is shown to provide high fault coverage for these fault models
Keywords :
automatic test pattern generation; combinational circuits; error correction; fault diagnosis; logic testing; redundancy; transforms; SAT formulation; arithmetic transform; combinational circuits; detection accuracy; don´t care approximations; error modeling; error-correcting properties; gate replacement faults; high fault coverage; redundant faults; redundant gate replacements identification; single stuck-at-value redundancy identification; structure-based ATPG scheme; test generation scheme; test vectors; wire replacement faults; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Redundancy; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966702
Filename :
966702
Link To Document :
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