DocumentCode
1914925
Title
AMLETO: a multi-language environment for functional test generation
Author
Fin, Alessandro ; Fummi, Franco ; Pravadelli, Graziano
Author_Institution
Dipt. di Informatica, Verona Univ., Italy
fYear
2001
fDate
2001
Firstpage
821
Lastpage
829
Abstract
More and more people are starting to use the SystemC description language to model and simulate new designs. This is due mainly to the simplicity and power of the language. The number of models written in SystemC currently available is still very limited and testing SystemC descriptions is still an open issue, since the language is new and researchers are looking for efficient error models and coverage metrics. This paper presents AMLETO, a multi-language environment developed to efficiently test embedded systems and IP-Cores. Using IIR, an HDL language independent representation, it supplies: fast translation from VHDL to SystemC of design descriptions and viceversa, generation and setup of customized TPGs for the design under test and generation of erroneous models capable of simulating the presence of design errors
Keywords
automatic test pattern generation; automatic test software; embedded systems; fault simulation; hardware description languages; programming environments; AMLETO; HDL language independent representation; IIR; IP-cores; SystemC description language; VHDL designs; customized TPGs; design error simulation; design under test; embedded systems; functional test generation; multi-language environment; Computational modeling; Delay; Electronic design automation and methodology; Embedded system; Error correction; Hardware design languages; History; Power system modeling; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966704
Filename
966704
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