Title :
A high-resolution jitter measurement technique using ADC sampling
Author :
Cherubal, Sasikumar ; Chatterjee, Abhijit
Author_Institution :
ARDEXT Technol., Atlanta, GA, USA
Abstract :
In this paper, we propose a new technique for jitter measurement that can be implemented using commercially available, off-the-shelf components. The technique implements a high-resolution, high-speed, phase detector using a high-speed Analog-to-Digital Converter (ADC). The technique is shown to have high resolution and low test time compared to currently available techniques. Experimental results to demonstrate the effectiveness of the technique are presented
Keywords :
analogue-digital conversion; digital integrated circuits; high-speed integrated circuits; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; phase detectors; production testing; signal sampling; timing jitter; ADC sampling; digital ICs; digital circuits; high-resolution high-speed phase detector; high-resolution jitter measurement technique; high-speed ADC; low test time; mixed-signal ICs; production testing; Circuit testing; Clocks; Current measurement; Detectors; Measurement techniques; Noise measurement; Phase detection; Sampling methods; Time measurement; Timing jitter;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966706
