Title :
An approach to consistent jitter modeling for various jitter aspects and measurement methods
Author :
Shimanouchi, Masashi
Author_Institution :
Schlumberger Semicond. Solutions, San Jose, CA, USA
Abstract :
Timing jitter, period jitter, long term jitter, jitter spectrum, SSB phase noise, etc. are terms that have been used to describe various aspects of jitter phenomena. While several jitter measurement techniques have been proposed with associated jitter models and modeling techniques, the relationship among various jitter aspects, and therefore, the relationship among various jitter measurement techniques is not very obvious. This paper analytically clarifies their relationship, and reviews several jitter measurement techniques based on the results of our analytical studies
Keywords :
integrated circuit measurement; integrated circuit modelling; integrated circuit noise; phase noise; timing jitter; SSB phase noise; equivalent noise voltage model; jitter aspects; jitter measurement techniques; jitter modeling; jitter spectrum; long term jitter; period jitter; phase noise model; timing jitter; Amplitude modulation; Attenuation measurement; Clocks; Measurement techniques; Noise measurement; Oscilloscopes; Phase measurement; Phase noise; Timing jitter; Voltage;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966707