Empirical Modeling of the Low-Frequency Noise Behaviour of InP-Based HEMTs

Author

van Meer, H. ; Simoen, E. ; van der Zanden, K. ; De Raedt, W. ; Valenza, M. ; Kaufmann, L.

Author_Institution

IMEC, Leuven, Belgium

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

412

Lastpage

415

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

Filename

1503576

Link To Document