Application of combined multiport reflectometer to microwave diversity imaging

Conventionally, the object scattered field for microwave diversity imaging is measured directly using a VNA. In this paper, we propose the construction, that uses a combined multiport reflectometer stead of six-port reflectometer, as proposed in, developed in a compact-range facility. The reconstructed images show even better quality, than those acquired using VNApsilas or a six-port circuit. These results indicate that with the use of a combined multiport reflectometer and statistical approach to its calibration, one can further reduce the cost of microwave diversity image facility and increase its overall precision.