• DocumentCode
    1915162
  • Title

    Rapid-response temperature control provides new defect screening opportunities

  • Author

    Malinoski, Mark ; West, Burnell G.

  • Author_Institution
    Delta Design Columbus, Westerville, OH, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    903
  • Lastpage
    907
  • Abstract
    Device defect detection using multiple temperature tests in high-volume manufacturing is made viable economically by introducing the ability to change the device temperature over a wide range without long delays
  • Keywords
    automatic testing; delays; fault diagnosis; integrated circuit testing; production testing; thermal analysis; defect screening opportunities; delays; device defect detection; device temperature; high-volume manufacturing; multiple temperature tests; production test; rapid-response temperature control; test flows; Automatic testing; Delay; Manufacturing; Microprocessors; Production; Sockets; Temperature control; Temperature dependence; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966713
  • Filename
    966713
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1915162