Title :
Rapid-response temperature control provides new defect screening opportunities
Author :
Malinoski, Mark ; West, Burnell G.
Author_Institution :
Delta Design Columbus, Westerville, OH, USA
Abstract :
Device defect detection using multiple temperature tests in high-volume manufacturing is made viable economically by introducing the ability to change the device temperature over a wide range without long delays
Keywords :
automatic testing; delays; fault diagnosis; integrated circuit testing; production testing; thermal analysis; defect screening opportunities; delays; device defect detection; device temperature; high-volume manufacturing; multiple temperature tests; production test; rapid-response temperature control; test flows; Automatic testing; Delay; Manufacturing; Microprocessors; Production; Sockets; Temperature control; Temperature dependence; Temperature distribution; Temperature sensors;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966713
