مرکز منطقه ای اطلاع رساني علوم و فناوري - Measurement of Ultra-low Noise Levels in Semiconductor Devices

DocumentCode :

1915202

Title :

Measurement of Ultra-low Noise Levels in Semiconductor Devices

Author :

Sampietro, M. ; Fasoli, L. ; Ferrari, G.

Author_Institution :

Politecnico di Milano, Italy

fYear :

1998

fDate :

8-10 Sept. 1998

Firstpage :

432

Lastpage :

435

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location :

Bordeaux, France

Print_ISBN :

2-86332-234-6

Type :

conf

Filename :

1503581

Link To Document :